Commit graph

4 commits

Author SHA1 Message Date
Kay Sievers
06190d8415 dmaengine: struct device - replace bus_id with dev_name(), dev_set_name()
Acked-by: Greg Kroah-Hartman <gregkh@suse.de>
Acked-by: Maciej Sosnowski <maciej.sosnowski@intel.com>
Signed-off-by: Kay Sievers <kay.sievers@vrfy.org>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
2008-11-11 13:12:33 -07:00
Andrew Morton
6fdb8bd471 drivers/dma/dmatest.c: switch a GFP_ATOMIC to GFP_KERNEL
It was needlessly using the unreliable GFP_ATOMIC.

Cc: Timur Tabi <timur@freescale.com>
Acked-by: Haavard Skinnemoen <haavard.skinnemoen@atmel.com>
Signed-off-by: Andrew Morton <akpm@linux-foundation.org>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
2008-09-19 04:16:23 -07:00
Timur Tabi
6b3141962d dmatest: properly handle duplicate DMA channels
Update the the dmatest driver so that it handles duplicate DMA channels
properly.

When a DMA client is notified of an available DMA channel, it must check if it
has already allocated resources for that channel.  If so, it should return
DMA_DUP.  This can happen, for example, if a DMA driver calls
dma_async_device_register() more than once.

Acked-by: Haavard Skinnemoen <haavard.skinnemoen@atmel.com>
Signed-off-by: Timur Tabi <timur@freescale.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
2008-09-19 04:16:19 -07:00
Haavard Skinnemoen
4a776f0aa9 dmatest: Simple DMA memcpy test client
This client tests DMA memcpy using various lengths and various offsets
into the source and destination buffers. It will initialize both
buffers with a repeatable pattern and verify that the DMA engine copies
the requested region and nothing more. It will also verify that the
bytes aren't swapped around, and that the source buffer isn't modified.

The dmatest module can be configured to test a specific device, a
specific channel. It can also test multiple channels at the same time,
and it can start multiple threads competing for the same channel.

Changes since v2:
  * Support testing multiple channels at the same time
  * Support testing with multiple threads competing for the same channel
  * Use counting test patterns in order to catch byte ordering issues

Changes since v1:
  * Remove extra dashes around "help"
  * Remove "default n" from Kconfig
  * Turn TEST_BUF_SIZE into a module parameter
  * Return DMA_NAK instead of DMA_DUP
  * Print unhandled events
  * Support testing specific channels and devices
  * Move to the end of the Makefile

Acked-by: Maciej Sosnowski <maciej.sosnowski@intel.com>
Signed-off-by: Haavard Skinnemoen <hskinnemoen@atmel.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
2008-07-08 11:58:45 -07:00